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Fischerscope X-RAY XUV 773


Materials Analysis Coating Analysis / Measurements X Ray Fluorescence Devices

X Ray Fluorescence Devices

  • Ray Fluorescence Devices Fischer-Fischerscope-X-RAY-XUV-773-mcscorpusa

Fischerscope X-RAY XUV 773

of Fischer

Description

The vacuum measurement chamber of devices in the XUV® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the radiation-absorbing properties of room air, it is normally not possible to use this method. For this reason the instrument is ideal for very demanding coating thickness measurement and material analysis tasks.

Features

  • Particularly suitable for research and development with their low detection limits, repeatable precision and universally upgradable measurement possibilities
  • Vacuum chamber and high-performance silicon drift detector for precise measurement, even of light elements
  • Automated serial testing with programmable X-, Y- and Z-axes
  • Adaptable to the demands of various materials and measurement conditions by means of exchangeable apertures and filters

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Description

The vacuum measurement chamber of devices in the XUV® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the radiation-absorbing properties of room air, it is normally not possible to use this method. For this reason the instrument is ideal for very demanding coating thickness measurement and material analysis tasks.

  • Particularly suitable for research and development with their low detection limits, repeatable precision and universally upgradable measurement possibilities
  • Vacuum chamber and high-performance silicon drift detector for precise measurement, even of light elements
  • Automated serial testing with programmable X-, Y- and Z-axes
  • Adaptable to the demands of various materials and measurement conditions by means of exchangeable apertures and filters
Ray Fluorescence Devices Fischer-Fischerscope-X-RAY-XUV-773-mcscorpusa
Applications
Data Sheet
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Layers of light elements from sodium onwards on the nm scale
Aluminum and silicon layers

Fischerscope XUV 773 Data Sheet (English)

Brochure X RAY Product Line Fischer (English)

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  • Ray Fluorescence Devices Fischer-Fischerscope-X-RAY-XUV-773-mcscorpusa

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